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Hot-point probe

From Wikipedia, the free encyclopedia

A hot point probe is a method of quickly determining whether a semiconductor sample is n-type or p-type. The sample is probed using a voltmeter or ammeter and a heat source, such as a soldering iron, is placed on one of the leads. The heat will cause charge carriers (electrons in n-type, holes in p-type) to move away from the lead. The heat from the probe creates an increased number of carriers, which then diffuse away from the contact point. This causes a current/voltage difference.

For example, if the heat source is placed on the positive lead of a voltmeter attached to an n-type semiconductor, a positive voltage reading will result as the area around the heat source/positive lead becomes positively charged.[1] A simple explanation is that the thermally-excited majority free carriers move from the hot probe to the cold probe. The mechanism for this motion with in semiconductor is diffusion type since the material is uniformly doped.[2]

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Transcription

References

  1. ^ "The Hot Point Probes". ECE Illinois. Archived from the original on 2010-06-16. Retrieved 2009-10-06.
  2. ^ "2.4.7.9 The "hot-probe" experiment". ecee.colorado.edu. Retrieved 27 November 2020.


This page was last edited on 1 September 2023, at 20:59
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